π¬ AI detects mulberry leaf diseases super fast
A new task-adapted YOLOv10 detector was developed to spot mulberry leaf diseases affecting leaf yield. Researchers from IIT Kharagpur tested this system on both an in-house and a public dataset. The detector achieved competitive performance against strong baselines on these datasets, with results published on September 24, 2026. This model can support leaf-level field scouting for better agricultural decision-making. The findings show a promising tool for modernizing sericulture practices. π¬